AFE1256

ACTIVE

256-channel analog front end (AFE) for flat-panel digital X-ray detectors

Product details

Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI Operating temperature range (°C) 0 to 70 Rating Catalog
Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI Operating temperature range (°C) 0 to 70 Rating Catalog
COF (TDS) 314 1064 mm² 38 x 28 DIESALE (TD) See data sheet
  • 256 Channels
  • On-Chip, 16-Bit ADC
  • Photodiode Short Immunity
  • Column Short Immunity
  • High Performance:
    • Noise: 758 e-RMS with 28-pF Sensor
      Capacitor in 1.2-pC Range
    • Integral Nonlinearity:
      ±2 LSB with Internal 16-Bit ADC
    • Minimum Scan Time:
      • 37.9 µs in Normal Mode
      • 20 µs in 2x Binning Mode
  • Integration:
    • Eight Selectable Full-Scale Ranges:
      0.15 pC (Min) to 9.6 pC (Max)
    • Built-In Correlated Double Sampler
    • 2x Binning (Averages Charge of Two Adjacent
      Channels) for Faster Throughput
    • Pipelined Integrate and Read: Allows Data
      Read During Integration
  • Flexibility:
    • Electron and Hole Integration
  • Low Power:
    • 2.9 mW/Ch with ADC
    • 2.3 mW/Ch without ADC
    • 0.1 mW/Ch in Nap Mode
    • Total Power-Down Feature
  • 22-mm × 5-mm Gold-Bump Die,
    Suitable for TCP and COF

Application

  • Flat-Panel, X-Ray Detector

All trademarks are the property of their respective owners.

  • 256 Channels
  • On-Chip, 16-Bit ADC
  • Photodiode Short Immunity
  • Column Short Immunity
  • High Performance:
    • Noise: 758 e-RMS with 28-pF Sensor
      Capacitor in 1.2-pC Range
    • Integral Nonlinearity:
      ±2 LSB with Internal 16-Bit ADC
    • Minimum Scan Time:
      • 37.9 µs in Normal Mode
      • 20 µs in 2x Binning Mode
  • Integration:
    • Eight Selectable Full-Scale Ranges:
      0.15 pC (Min) to 9.6 pC (Max)
    • Built-In Correlated Double Sampler
    • 2x Binning (Averages Charge of Two Adjacent
      Channels) for Faster Throughput
    • Pipelined Integrate and Read: Allows Data
      Read During Integration
  • Flexibility:
    • Electron and Hole Integration
  • Low Power:
    • 2.9 mW/Ch with ADC
    • 2.3 mW/Ch without ADC
    • 0.1 mW/Ch in Nap Mode
    • Total Power-Down Feature
  • 22-mm × 5-mm Gold-Bump Die,
    Suitable for TCP and COF

Application

  • Flat-Panel, X-Ray Detector

All trademarks are the property of their respective owners.

The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format.

Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems.

The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms.

To request a full data sheet or other design resources: request AFE1256

The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format.

Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems.

The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms.

To request a full data sheet or other design resources: request AFE1256

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More Information

Full data sheet and other design resources are available under NDA. Request now

Technical documentation

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Type Title Date
* Data sheet AFE1256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors datasheet (Rev. D) PDF | HTML 26 May 2016
Analog Design Journal Selecting a multichannel ultra-low-current measurement IC PDF | HTML 18 Mar 2022
EVM User's guide AFE1256COF EVM Introduction User Guide 05 Nov 2013

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

AFE1256EVM — AFE1256 256-channel AFE for flat-panel digital X-ray detectors evaluation module

The AFE1256EVM is a compact USB based evaluation kit for evaluating the AFE1256 COF, a 256-channel analog front-end. The EVM is self-contained with DACs and on board pattern generator built , greatly reducing its dependency on external equipment so all it needs is a power supply. The kit consists (...)

User guide: PDF
Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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COF (TDS) 314 View options
DIESALE (TD)

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